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  A. Nélis, Ian Vickridge, J.-J. Ganem, E. Briand, G. Terwagne. 18O(p,α)15N isotopic tracing of germanium diffusion in SiO2/Si films. Journal of Applied Physics, American Institute of Physics, 2021, 130 (10), pp.105701. ⟨10.1063/5.0057968⟩. ⟨hal-03453694⟩
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