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hal-01981672v1
Journal articles
Plasma emission correction in reflectivity spectroscopy during sputtering deposition Journal of Physics D: Applied Physics, IOP Publishing, 2019, 52 (9), pp.095202. ⟨10.1088/1361-6463/aaf494⟩ |
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Journal articles
A new method for high resolution curvature measurement applied to stress monitoring in thin films Nanotechnology, Institute of Physics, 2022, 33 (18), ⟨10.1088/1361-6528/ac4a2a⟩ |
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Journal articles
Plasmonics of Supported Nanoparticles Reveals Adhesion at the Nanoscale: Implications for Metals on Dielectrics ACS Applied Nano Materials, American Chemical Society, 2020, 3 (12), pp.12157-12168. ⟨10.1021/acsanm.0c02656⟩ |
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hal-03381625v1
Journal articles
Kinetics and mechanisms of stress relaxation in sputtered silver thin films Acta Materialia, Elsevier, 2021, pp.117385. ⟨10.1016/j.actamat.2021.117385⟩ |
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