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hal-01237481v1  Journal articles
A. Baron-WiechecJ. J. GanemS. J. Garcia-VergaraP. SkeldonG. E. Thompson et al.  (18)O Tracer Study of Porous Film Growth on Aluminum in Phosphoric Acid
Journal of The Electrochemical Society, Electrochemical Society, 2010, 157 (11), pp.C399-C407. ⟨10.1149/1.3490640⟩
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hal-01243711v1  Journal articles
Victor Alarcon-DiezMahmoud EddrieffIan Vickridge. Rutherford Backscattering Spectrometry analysis of iron-containing Bi2Se3 Topological Insulator thin films
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier, 2015, 371, pp.224-229. ⟨10.1016/j.nimb.2015.11.031⟩
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hal-01484071v1  Journal articles
V. Alarcon-DiezIan VickridgeM. JakšićV. GriljB. Schmidt et al.  Charge Collection Efficiency in a segmented semiconductor detector interstrip region
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier, 2017, 406 (Part A), pp.148-151. ⟨10.1016/j.nimb.2017.01.074⟩
hal-01288831v1  Journal articles
Np BarradasN AddedWm ArnoldbikI Bogdanovic-RadovicW Bohne et al.  A round robin characterisation of the thickness and composition of thin to ultra-thin AlNO films
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier, 2005, 227 (3), pp.397-419. ⟨10.1016/j.nimb.2004.08.021⟩
hal-01288839v1  Journal articles
Zs XiaoR SernaCn AfonsoIan Vickridge. Broadband infrared emission from Er-Tm : Al2O3 thin films
Applied Physics Letters, American Institute of Physics, 2005, 87 (11), pp.111103. ⟨10.1063/1.2040005⟩
hal-01237370v1  Journal articles
A. l'HoirJ. J. GanemI. TrimailleIan Vickridge. Direct measurement of molecular breakup dynamics and vicinage effect of swift proton clusters using narrow nuclear resonance profiling
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier, 2010, 268 (17-18), pp.2850-2853. ⟨10.1016/j.nimb.2010.06.044⟩
hal-01288842v1  Journal articles
I JarrigeP JonnardIan Vickridge. Control of the reactivity at a metal/silica interface
Applied Physics Letters, American Institute of Physics, 2005, 86 (20), pp.204105. ⟨10.1063/1.1931821⟩
hal-01290168v1  Journal articles
Ian VickridgeJean-Jacques GanemY. HoshinoIsabelle Trimaille. Growth of SiO2 on SiC by dry thermal oxidation: mechanisms
Journal of Physics D: Applied Physics, IOP Publishing, 2007, 40 (20), pp.6254-6263. ⟨10.1088/0022-3727/40/20/S10⟩
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hal-03453694v1  Journal articles
A. NélisIan VickridgeJ.-J. GanemE. BriandG. Terwagne. 18O(p,α)15N isotopic tracing of germanium diffusion in SiO2/Si films
Journal of Applied Physics, American Institute of Physics, 2021, 130 (10), pp.105701. ⟨10.1063/5.0057968⟩
hal-02323456v1  Journal articles
Grazia LaricchiutaWilfried VandervorstIan VickridgeMatej MayerJohan Meersschaut. Rutherford backscattering spectrometry analysis of InGaAs nanostructures
Journal of Vacuum Science and Technology A, American Vacuum Society, 2019, 37 (2), pp.020601. ⟨10.1116/1.5079520⟩
in2p3-00005570v1  Conference papers
Ian VickridgeO. KaitasovR.J. ChaterJ.A. Kilner. Silicon isotopic tracing with the $^{29}$Si(p, $\gamma$) narrow resonance near 415 keV
Ion Beam Analysis Accelerators in Applied Research and Technology International Conference on Ion Beam Analysis 14 European Conference on Accelerators in Applied Research and Technology 6, Jul 1999, Dresden, Germany. pp.441-445
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hal-03264045v1  Journal articles
B. XiaJ.J. GanemS. SteydliH. TancrezIan Vickridge. RBS and NRA analysis for films with high growth rate prepared by atomic layer deposition
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier, 2021, 489, pp.20-25. ⟨10.1016/j.nimb.2020.12.015⟩
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hal-02142094v1  Journal articles
J.P. ZhangC. PendenqueK. Le GuenR. DelaunayIan Vickridge et al.  Kossel interferences of proton-induced X-ray emission lines to study thin film waveguides
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier, 2019, 452, pp.12-20. ⟨10.1016/j.nimb.2019.05.053⟩
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hal-01909419v1  Journal articles
Karine Le GuenJean-Michel AndréMeiyi WuVita IlakovacFranck Delmotte et al.  Kossel Effect in Periodic Multilayers
Journal of Nanoscience and Nanotechnology, American Scientific Publishers, 2019, 19 (1), pp.593 - 601. ⟨10.1166/jnn.2019.16472⟩
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hal-02162011v1  Journal articles
Meiyi WuKarine Le GuenJean-Michel AndréPhilippe JonnardIan Vickridge et al.  Kossel diffraction observed with X-ray color camera during PIXE of nano-scale periodic multilayer
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier, 2019, 450, pp.252-256. ⟨10.1016/j.nimb.2018.08.008⟩