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hal-01374375v3  Journal articles
Meiyi WuKarine Le GuenJean-Michel AndréVita IlakovacIan Vickridge et al.  Kossel interferences of proton-induced X-ray emission lines in periodic multilayers
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier, 2016, 386 (1), pp.39 - 43. ⟨10.1016/j.nimb.2016.09.014⟩
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hal-03264045v1  Journal articles
B. XiaJ.J. J GanemS. SteydliH. TancrezIan Vickridge. RBS and NRA analysis for films with high growth rate prepared by atomic layer deposition
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier, 2021, 489, pp.20-25. ⟨10.1016/j.nimb.2020.12.015⟩
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hal-01484071v1  Journal articles
V. Alarcon-DiezI. VickridgeM. JakšićV. GriljB. Schmidt et al.  Charge Collection Efficiency in a segmented semiconductor detector interstrip region
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier, 2017, 406 (Part A), pp.148-151. ⟨10.1016/j.nimb.2017.01.074⟩
hal-02323456v1  Journal articles
Grazia LaricchiutaWilfried VandervorstIan VickridgeMatej MayerJohan Meersschaut. Rutherford backscattering spectrometry analysis of InGaAs nanostructures
Journal of Vacuum Science and Technology A, American Vacuum Society, 2019, 37 (2), pp.020601. ⟨10.1116/1.5079520⟩
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hal-02142094v1  Journal articles
J.P. ZhangC. PendenqueK. Le GuenR. DelaunayI. Vickridge et al.  Kossel interferences of proton-induced X-ray emission lines to study thin film waveguides
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier, 2019, 452, pp.12-20. ⟨10.1016/j.nimb.2019.05.053⟩
hal-01540370v1  Poster communications
Y. LuD. BenzeggoutaH. NguyenRatiba BenzergaC. Le Paven et al.  Dépôt et Caractérisation de Couches Minces Diélectriques La-Ti-O-N.
Ion Beam Analysis Francophone, 2012, Cadarache, France. 2012
hal-01237487v1  Journal articles
Y. KitsudoK. ShibuyaT. NishimuraY. HoshinoIan Vickridge et al.  Charge exchange of medium energy H and He ions emerging from solid surfaces
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier, 2009, 267 (4), pp.566-570. ⟨10.1016/j.nimb.2008.11.010⟩
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hal-01909419v1  Journal articles
Karine Le GuenJean-Michel AndréMeiyi WuVita IlakovacFranck Delmotte et al.  Kossel Effect in Periodic Multilayers
Journal of Nanoscience and Nanotechnology, American Scientific Publishers, 2019, 19 (1), pp.593 - 601. ⟨10.1166/jnn.2019.16472⟩
hal-01237362v1  Journal articles
A. F. GurbichD. AbriolaN. P. BarradasA. R. RamosI. Bogdanovic-Radovic et al.  Measurements and Evaluation of Differential Cross-sections for Ion Beam Analysis
Journal of the Korean Physical Society, Korean physical society, 2011, 59 (2, 3, SI), pp.2010-2013. ⟨10.3938/jkps.59.2010⟩
hal-01237370v1  Journal articles
A. L'HoirJ. J. GanemI. TrimailleI. C. Vickridge. Direct measurement of molecular breakup dynamics and vicinage effect of swift proton clusters using narrow nuclear resonance profiling
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier, 2010, 268 (17-18), pp.2850-2853. ⟨10.1016/j.nimb.2010.06.044⟩
hal-01290152v1  Journal articles
Hans Henrik AndersenMark BreeseLynn RehnChristina TrautmannIan Vickridge. NIMB Editorial for 2008
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier, 2008, 266 (1), pp.1. ⟨10.1016/j.nimb.2007.11.032⟩
hal-01288829v1  Journal articles
Ian VickridgeE. P. GusevJean-Jacques GanemIsabelle Trimaille. Thermal ammonia nitridation on HfO2 and hafnium silicates thin films
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier, 2006, 249, pp.517-522. ⟨10.1016/j.nimb.2006.03.169⟩
hal-01288841v1  Journal articles
H ColderR RizkM MoralesP MarieJ Vicens et al.  Influence of substrate temperature on growth of nanocrystalline silicon carbide by reactive magnetron sputtering
Journal of Applied Physics, American Institute of Physics, 2005, 98 (2), pp.024313. ⟨10.1063/1.1985975⟩
hal-01237467v1  Journal articles
C. LobreD. JalabertIan VickridgeEmrick BriandD. Benzeggouta et al.  Quantitative damage depth profiles in arsenic implanted HgCdTe
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier, 2013, 313, pp.76-80. ⟨10.1016/j.nimb.2013.07.019⟩
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hal-03453694v1  Journal articles
A. NélisIan VickridgeJ.-J. GanemE. BriandG. Terwagne. 18O(p,α)15N isotopic tracing of germanium diffusion in SiO2/Si films
Journal of Applied Physics, American Institute of Physics, 2021, 130 (10), pp.105701. ⟨10.1063/5.0057968⟩
hal-01237486v1  Journal articles
N. P. BarradasR. MateusM. FonsecaM. A. ReisK. Lorenz et al.  Thin film depth profiling using simultaneous particle backscattering and nuclear resonance profiling
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier, 2010, 268 (11-12), pp.1829-1832. ⟨10.1016/j.nimb.2010.02.092⟩
hal-01290150v1  Journal articles
A. GurbichI. Bogdanovic-RadovicM. ChiariC. JeynesM. Kokkoris et al.  Status of the problem of nuclear cross section data for IBA
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier, 2008, 266 (8), pp.1198-1202. ⟨10.1016/j.nimb.2007.11.041⟩
hal-01288833v1  Conference papers
H ColderM MoralesR RizkIan Vickridge. Characterization of SiC thin film obtained by magnetron reactive sputtering : IBA, IR and Raman studies
5th European Conference on Silicon Carbide and Related Materials, Aug 2004, Bologna, Unknown Region. pp.287-290