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hal-03601084v1
Journal articles
A new method for high resolution curvature measurement applied to stress monitoring in thin films Nanotechnology, Institute of Physics, 2022, 33 (18), ⟨10.1088/1361-6528/ac4a2a⟩ |
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hal-03381625v1
Journal articles
Kinetics and mechanisms of stress relaxation in sputtered silver thin films Acta Materialia, Elsevier, 2021, pp.117385. ⟨10.1016/j.actamat.2021.117385⟩ |
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