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hal-01229139v1
Journal articles
Wojciech Szuszkiewicz, Michel Jouanne, Jean-François Morhange, Makoto Kanehisa, Elzbieta Dynowska et al. Raman scattering as a tool to characterize semiconductor crystals, thin layers, and low-dimensional structures containing transition metalsphysica status solidi (b), Wiley, 2014, 251 (6), pp.1133-1143. ⟨10.1002/pssb.201350142⟩
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