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hal-01281492v1  Journal articles
I. StengerBruno GallasL. SiozadeS. FissonG. Vuye et al.  Study of the interface Si-nc/SiO2 by infrared spectroscopic ellipsometry and X-ray photoelectron spectroscopy
Physica E: Low-dimensional Systems and Nanostructures, Elsevier, 2007, 38 (1-2), pp.176-180. ⟨10.1016/j.physe.2006.12.032⟩
hal-00021446v1  Journal articles
C.V. RamanaM. MassotC.M. Julien. XPS and Raman spectroscopic characterization of LiMn2O4 spinels.
Surface and Interface Analysis, Wiley-Blackwell, 2005, 37, pp.412-416. ⟨10.1002/sia.2022⟩