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Communication Dans Un Congrès Année : 2018

High precision metrology for large bandpass filters

Résumé

High precision measurements of the filters bandpass used on wide-field imagers mounted on large telescopes is critical for type Ia supernovae studies. A dedicated spectrophotometric bench is used to re-measure the now decommissioned ugriz filters used for the SNLS on CFHT-MegaCam. A full characterization of the optical response with respect to the location on the surface and the angle of incidence was performed for each filter. Strong variation over the filter surface is observed. The impact of the actual response on the observation is evaluated and we demonstrate an improvement with respect to the previous published results (SNLS1 and 2). © (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
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Dates et versions

hal-01945492 , version 1 (05-12-2018)

Identifiants

Citer

Benoît Sassolas, Marc Bétoule, Nicolas Regnault, Bernard Lagrange, David Hofman, et al.. High precision metrology for large bandpass filters. SPIE Astronomical Telescopes + Instrumentation 2018, Jun 2018, Austin, United States. pp.107064E, ⟨10.1117/12.2312003⟩. ⟨hal-01945492⟩
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