HAL will be down for maintenance from Friday, June 10 at 4pm through Monday, June 13 at 9am. More information
Skip to Main content Skip to Navigation

emse-00436105v1  Journal articles
Jean-Paul ThomasMireille FallavierJean-Marie MackowskiChristophe PijolatJean Tousset et al.  Amorphous semiconductor thin films characterization by nuclear microanalysis
Journal of Radioanalytical Chemistry, Springer-Verlag, 1980, 55 (2), pp.427-443