“ Copper sample analyzed with an n-doped silicon tip using conducting probe atomic force microscopy - Archive ouverte HAL Access content directly
Journal Articles Journal of Vacuum Science and Technology Year : 2002

“ Copper sample analyzed with an n-doped silicon tip using conducting probe atomic force microscopy

(1) , (1) , (1) , (1) , (1)
1
Not file

Dates and versions

hal-00098202 , version 1 (25-09-2006)

Identifiers

  • HAL Id : hal-00098202 , version 1

Cite

Olivier Schneegans, Lionel Boyer, Frédéric Houzé, René Meyer, Pascal Chrétien. “ Copper sample analyzed with an n-doped silicon tip using conducting probe atomic force microscopy. Journal of Vacuum Science and Technology, 2002, 20, pp.1929. ⟨hal-00098202⟩
55 View
0 Download

Share

Gmail Facebook Twitter LinkedIn More