“ Copper sample analyzed with an n-doped silicon tip using conducting probe atomic force microscopy

Olivier Schneegans (1) , Lionel Boyer (1) , Frédéric Houzé (1) , René Meyer (1) , Pascal Chrétien (1)

1 LGEP - Laboratoire de génie électrique de Paris

Mots clés: AFM; conducting tip; current-voltage curve

Domaines: Chimie-Physique [physics.chem-ph]

Olivier Schneegans, Lionel Boyer, Frédéric Houzé, René Meyer, Pascal Chrétien. “ Copper sample analyzed with an n-doped silicon tip using conducting probe atomic force microscopy. Journal of Vacuum Science and Technology, 2002, 20, pp.1929. ⟨hal-00098202⟩