“ Copper sample analyzed with an n-doped silicon tip using conducting probe atomic force microscopy

Olivier Schneegans; Lionel Boyer; Frédéric Houzé; René Meyer; Pascal Chrétien

Journal Articles Journal of Vacuum Science and Technology Year : 2002

“ Copper sample analyzed with an n-doped silicon tip using conducting probe atomic force microscopy

(1) , (1) , (1) , (1) , (1)

1

Olivier Schneegans

Function : Author
PersonId : 15895
IdHAL : olivier-schneegans
ORCID : 0000-0001-9741-3327
IdRef : 18007007X

Laboratoire de génie électrique de Paris

Lionel Boyer

Function : Author

Laboratoire de génie électrique de Paris

Frédéric Houzé

Function : Author
PersonId : 13067
IdHAL : frederic-houze
ORCID : 0000-0001-8054-3184
IdRef : 15620584X

Laboratoire de génie électrique de Paris

CV

René Meyer

Function : Author

Laboratoire de génie électrique de Paris

Pascal Chrétien

Function : Author
PersonId : 5981
IdHAL : pascal-chretien

Laboratoire de génie électrique de Paris

CV

Keywords

AFM conducting tip current-voltage curve

Domains

Physics [physics] Physics [physics] Chemical Physics [physics.chem-ph]

Olivier Schneegans : Connect in order to contact the contributor

https://hal.science/hal-00098202

Submitted on : Monday, September 25, 2006-10:42:34 AM

Last modification on : Thursday, December 22, 2022-3:31:23 AM

Dates and versions

hal-00098202 , version 1 (25-09-2006)

Identifiers

HAL Id : hal-00098202 , version 1

Cite

Olivier Schneegans, Lionel Boyer, Frédéric Houzé, René Meyer, Pascal Chrétien. “ Copper sample analyzed with an n-doped silicon tip using conducting probe atomic force microscopy. Journal of Vacuum Science and Technology, 2002, 20, pp.1929. ⟨hal-00098202⟩

“ Copper sample analyzed with an n-doped silicon tip using conducting probe atomic force microscopy

Keywords

Domains

Dates and versions

Identifiers

Cite

Export

Collections

Share