X-ray spectroscopy characterization of Ar$^{17+}$ produced by an ECRIS in the afterglow mode

Christophe Prigent (1) , Emily Lamour (1) , Laurent Maunoury (2) , Fabien Noury (2) , J.Y. Pacquet (3) , Jean Marc Ramillon (2) , J. -P. Rozet (1) , Dominique Vernhet (1) , Martino Trassinelli (1)

1 INSP - Institut des Nanosciences de Paris
2 CIRIL - Centre Interdisciplinaire de Recherche Ions Lasers
3 GANIL - Grand Accélérateur National d'Ions Lourds

An electron–cyclotron–resonance ion source (ECRIS) operating in the afterglow mode allows to produce pulsed highly charged ion beams. We present a characterization of the first production of pulsed Ar17+ ions from an ECRIS using X-ray spectroscopy techniques. An ion current increase of a factor 3-4 compared to the continuous operating mode with a short rise time (< 100 µs) and a full width at half maximum of 500 µs has been obtained.

Domaines: Physique Atomique [physics.atom-ph]

Christophe Prigent, Emily Lamour, Laurent Maunoury, Fabien Noury, J.Y. Pacquet, et al.. X-ray spectroscopy characterization of Ar$^{17+}$ produced by an ECRIS in the afterglow mode. 14TH INTERNATIONAL CONFERENCE ON THE PHYSICS OF HIGHLY CHARGED IONS (HCI 2008), Sep 2008, Tokyo, Japan. pp.012111, ⟨10.1088/1742-6596/163/1/012111⟩. ⟨hal-00425366⟩