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Article Dans Une Revue Journal of Physics Année : 2009

Novel XAFS capabilities at ELETTRA synchrotron light source

Résumé

The optical layout of the XAFS beamline at ELETTRA is presented along with its powerful capabilities for collecting XAFS spectra in a wide energy range 2.4 - 27 keV. Recent developments around the ensemble of available instruments made available different collection modes using various sample environments. In particular combined x-ray absorption and diffraction patterns can be collected even at high temperature using a special version of the l'Aquila-Camerino furnace and a MAR image-plate detector. An automated beamline control software allows us to perform successive measurements in different conditions without attending the beamline. Examples of XAFS and diffraction measurements, as well as single-energy temperature scans are presented showing the performances of the beamline for nanocrystalline systems and liquid metals under high temperature conditions.

Dates et versions

hal-00465269 , version 1 (19-03-2010)

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Citer

Andrea Di Cicco, Giuliana Aquilanti, Marco Minicucci, Emiliano Principi, Nicola Novello, et al.. Novel XAFS capabilities at ELETTRA synchrotron light source. Journal of Physics, 2009, 190, pp.012043. ⟨10.1088/1742-6596/190/1/012043⟩. ⟨hal-00465269⟩
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