Simulation of X-ray Traverse Topographs by Means of a Computer

Yves Epelboin (1) , Alain Soyer (1)

1 LMCP - Laboratoire de minéralogie, cristallographie de Paris

The precision of the numerical algorithm used is the critical factor in computing traverse topographs. The varying-step algorithm allows such a computation. Images have been computed simulating the real experiment, i.e. by the addition of the intensities of individual section topographs. Results are in good agreement with experiments: it has been possible to characterize dislocations fully by the study of the fine details of their contrast. This may be of practical interest whenever section topographs cannot be used, as, for instance, in the case of thin crystals.

Mots clés: Image simulation; X-ray topography

Domaines: Science des matériaux [cond-mat.mtrl-sci]

Yves Epelboin, Alain Soyer. Simulation of X-ray Traverse Topographs by Means of a Computer. Acta Crystallographica Section A : Foundations and Advances [2014-..], 1985, 41 (1), pp.67-72. ⟨10.1107/S0108767385000113⟩. ⟨hal-01213427⟩