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Journal Articles Applied physics. A, Materials science & processing Year : 2007

ZnO : Mn as a member of II-VI : Mn family

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Abstract

ZnO:Mn thin films are grown by the metal organic chemical vapor deposition technique. Mn (x) varies in the 0 < x < 0.44 range. Vegard's law has been verified for the lattice parameters. Electron paramagnetic resonance (EPR) measurements prove the substitutional incorporation of Mn2+ on zinc sites. The behavior of the EPR line width regarding temperature is discussed. All ZnO:Mn layers show antiferromagnetic interaction and a J(1)/k(B)=-15 K effective exchange constant. The optical band gap of ZnO:Mn increases with the manganese concentration. Raman spectroscopy reveals a Mn-related scattering band.

Dates and versions

hal-01290172 , version 1 (17-03-2016)

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E. Chikoidze, Y. Dumont, Jurgen von Bardeleben, J. Gleize, F. Jomard, et al.. ZnO : Mn as a member of II-VI : Mn family. Applied physics. A, Materials science & processing, 2007, 88 (1), pp.167-171. ⟨10.1007/s00339-007-3947-3⟩. ⟨hal-01290172⟩
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