Atomic force microscope tip localization and tracking through deep learning based vision inside an electron microscope

Shuai Liang , Mokrane Boudaoud (1) , Catherine Achard (2, 3) , Weibin Rong , Stéphane Régnier (2, 4, 5)

1 FEMTO-ST - Franche-Comté Électronique Mécanique, Thermique et Optique - Sciences et Technologies (UMR 6174)
2 ISIR - Institut des Systèmes Intelligents et de Robotique
3 PIROS - Perception, Interaction, Robotique sociales
4 Interactions Multi-échelles
5 SU - Sorbonne Université

Domaines: Automatique / Robotique

Shuai Liang, Mokrane Boudaoud, Catherine Achard, Weibin Rong, Stéphane Régnier. Atomic force microscope tip localization and tracking through deep learning based vision inside an electron microscope. 2019 IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS), Nov 2019, Macau, France. pp.2435-2440, ⟨10.1109/IROS40897.2019.8968567⟩. ⟨hal-02477481⟩