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Book Sections Year : 2015

Non-Destructive Characterization by Spectroscopic Ellipsometry of Interfaces in Mechatronic Devices

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insu-01155342 , version 1 (26-05-2015)

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Pierre-Richard Dahoo, Malika Khettab, Jorge Linares, Philippe Pougnet. Non-Destructive Characterization by Spectroscopic Ellipsometry of Interfaces in Mechatronic Devices. Abdelkhalak El Hami et Philippe Pougnet. Embedded Mechatronic Systems 1. Analysis of Failures, Predictive Reliability, Elsevier, Chapter 2, 2015, 978-1-78548-013-3. ⟨10.1016/B978-1-78548-013-3.50002-4⟩. ⟨insu-01155342⟩
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