Imaging and quality assessment of high-harmonic focal spots - Archive ouverte HAL Access content directly
Journal Articles Optics Letters Year : 2003

Imaging and quality assessment of high-harmonic focal spots

(1) , (1) , (1) , (1) , (1) , (1) , (1) , (1) , (1) , (1)
1

Abstract

We present a direct method of studying the focusability of an intense, short-pulse extreme-ultraviolet (XUV) beam obtained by high-harmonic generation. We perform near-field imaging of the focal spot of five high-harmonic orders strongly focused by a broadband toroidal mirror. To visualize the focal spot directly, we image the fluorescence induced by an XUV beam on a cerium-doped YAG crystal on a visible CCD camera. We can thus measure the harmonic spot size on a single image, together with the Strehl ratio, to evaluate the quality of focusing. Such techniques should become instrumental in optimizing the focusing conditions and reaching intensities required for exploring attosecond nonlinear optics in the XUV range.
Not file

Dates and versions

hal-00522992 , version 1 (04-10-2010)

Identifiers

Cite

C. Valentin, D. Douillet, S. Kazamias, Thierry Lefrou, G. Grillon, et al.. Imaging and quality assessment of high-harmonic focal spots. Optics Letters, 2003, 28 (12), pp.1049-1051. ⟨10.1364/OL.28.001049⟩. ⟨hal-00522992⟩
119 View
0 Download

Altmetric

Share

Gmail Facebook Twitter LinkedIn More