Femtosecond Soft X-Ray Laser by Temporal Ionization Gating

Stéphane Sebban 1 A. Depresseux 1 Julien Gautier 1 F. Tissandier 1 Agustin Lifschitz 1 Kim Ta Phuoc 1 Philippe Zeitoun 1 Eduardo Oliva 2 G. Maynard 3 J. Nejdl 4 M. Kozlova 4 H. T. Kim, 5 Sylvie Jacquemot 6, 7
1 LOA - Laboratoire d'optique appliquée
2 IIFN - Univ Politecn Madrid, ETS Ingenieros Ind, Inst Fusin Nucl, C Jose Gutierrez Abascal 2, E-28006 Madrid, Spain
3 LPGP - Laboratoire de Physique des Gaz et des Plasmas
4 ASCR - Czech Academy of Sciences [Prague]
5 GIST - Gwangju Institute of Science and Technology
6 DAM/DIF - DAM Île-de-France
7 LULI - Laboratoire pour l'utilisation des lasers intenses
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Conference papers
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https://hal-ensta-paris.archives-ouvertes.fr//hal-01402267
Contributor : Pierre Zaparucha <>
Submitted on : Thursday, November 24, 2016 - 2:42:31 PM
Last modification on : Wednesday, July 3, 2019 - 10:48:03 AM

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Citation

Stéphane Sebban, A. Depresseux, Julien Gautier, F. Tissandier, Agustin Lifschitz, et al.. Femtosecond Soft X-Ray Laser by Temporal Ionization Gating. IEEE International Conference on Plasma Sciences (ICOPS), May 2015, Belek, Turkey. ⟨10.1109/PLASMA.2015.7179997⟩. ⟨hal-01402267⟩

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