Absolute Spectral Radiation Measurements From 200-ns 200-kA X-Pinch in 10-eV-10-keV Range With 1-ns Resolution - ENSTA Paris - École nationale supérieure de techniques avancées Paris Accéder directement au contenu
Article Dans Une Revue IEEE Transactions on Plasma Science Année : 2009

Absolute Spectral Radiation Measurements From 200-ns 200-kA X-Pinch in 10-eV-10-keV Range With 1-ns Resolution

Résumé

A series of seven X-ray diodes and four Si p-i-n detectors with K- and L-filters was employed to measure the absolute time-resolved spectra of 200-ns 200-kA molybdenum and copper X-pinch plasmas. We observe a 10-mum-size 0.4-0.7-ns X-ray source at a total power yield level of 1.5 GW with about 35% in the range above 1 keV. The extreme ultraviolet part of the spectrum can be fitted by a Planckian function with a temperature of 65-75 eV. In the region above 800 eV, the spectrum can be fitted by an exponential distribution with an effective temperature of ~1 keV for Mo X-pinch and ~500 eV for Cu plasma. The X-ray source yields 200-550 mJ in this spectral range. The total XUV and X-ray yield varies in the range 10-30 J.
Fichier non déposé

Dates et versions

hal-01551682 , version 1 (30-06-2017)

Identifiants

Citer

Léonid Arantchouk, Jean Larour. Absolute Spectral Radiation Measurements From 200-ns 200-kA X-Pinch in 10-eV-10-keV Range With 1-ns Resolution. IEEE Transactions on Plasma Science, 2009, 37 (4), pp.575-579. ⟨10.1109/TPS.2009.2013229⟩. ⟨hal-01551682⟩
65 Consultations
0 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More