Adrien Hervy, Laurent Gallais, Gilles Cheriaux, Daniel Mouricaud. Femtosecond laser-induced damage threshold of electron beam deposited dielectrics for 1-m class optics.
Optical Engineering, SPIE, 2017, 56, pp.011001.
⟨10.1117/1.OE.56.1.011001⟩.
⟨hal-01586650⟩