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Femtosecond laser-induced damage threshold of electron beam deposited dielectrics for 1-m class optics

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https://hal.archives-ouvertes.fr/hal-01586650
Contributor : Laurent Gallais Connect in order to contact the contributor
Submitted on : Wednesday, September 13, 2017 - 9:42:48 AM
Last modification on : Wednesday, May 11, 2022 - 3:22:04 PM

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Adrien Hervy, Laurent Gallais, Gilles Cheriaux, Daniel Mouricaud. Femtosecond laser-induced damage threshold of electron beam deposited dielectrics for 1-m class optics. Optical Engineering, SPIE, 2017, 56, pp.011001. ⟨10.1117/1.OE.56.1.011001⟩. ⟨hal-01586650⟩

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