Sub-wavelength sensing of bi-periodic materials using topological sensitivity of second-order homogenized model - ENSTA Paris - École nationale supérieure de techniques avancées Paris Accéder directement au contenu
Article Dans Une Revue Journal of Physics: Conference Series Année : 2018

Sub-wavelength sensing of bi-periodic materials using topological sensitivity of second-order homogenized model

Résumé

We aim to detect defects or perturbations of periodic media, e.g. due to a defective manufacturing process. To this end, we consider scalar waves in such media through the lens of a second-order macroscopic description, and we compute the sensitivities of the germane effective parameters due to topological perturbations of a microscopic unit cell. Specifically, our analysis focuses on the tensorial coefficients in the governing mean-field equation – including both the leading order (i.e. quasi-static) terms, and their second-order companions bearing the effects of incipient wave dispersion. Then, we present a method that permits sub-wavelength sensing of periodic media, given the (anisotropic) phase velocity of plane waves illuminating the considered medium for several angles and wavenumbers.
Fichier principal
Vignette du fichier
pdf (716.36 Ko) Télécharger le fichier
Origine : Publication financée par une institution

Dates et versions

hal-01972083 , version 1 (17-07-2019)

Identifiants

Citer

Marc Bonnet, Rémi Cornaggia, Bojan B Guzina. Sub-wavelength sensing of bi-periodic materials using topological sensitivity of second-order homogenized model. Journal of Physics: Conference Series, 2018, 1131, pp.012008. ⟨10.1088/1742-6596/1131/1/012008⟩. ⟨hal-01972083⟩
106 Consultations
25 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More