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Journal Articles Journal de Physique Colloques Year : 1986

A laboratory reflEXAFS spectrometer

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Abstract

A simple spectrometer using a conventional X-ray generator has been constructed for ReflEXAFS measurements at glancing angle. The X-ray source is a sealed X-ray tube with a parabolic mirror. A monochromator with two flat LiF crystals is used. The energy resolution amounts to 8.5 eV at 8 keV. A proportional counter monitors the incident X-ray intensity and a NaI scintillation detector measures the intensity of the reflected beam. This system is free from fluctuations of the incident X-ray intensity and harmonics can be rejected with the energy discrimination. The range of energy is 7 to 18 keV. The ReflEXAFS spectra related to the surface of a nickel sample and a thermally oxided nickel sample are presented.
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Dates and versions

jpa-00226107 , version 1 (01-01-1986)

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Louis Bosio, Robert Cortès, Guy Folcher. A laboratory reflEXAFS spectrometer. Journal de Physique Colloques, 1986, 47 (C8), pp.C8-113-C8-116. ⟨10.1051/jphyscol:1986820⟩. ⟨jpa-00226107⟩
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